News
In the "International Journal Of Engineering Sciences & Research Technology" by academician of ANAS D. Tagıyev, D.Sc. E. Salakhova et.al ( IF3,785) monography has been published
Nov 01, 2016 | 12:00 / Important events
Read 5097 time (-s)

In this monography “Investigation  of  Voltampere  Characteristics of  Diodic Structure on Base of Thin Films of Rhenium Chalcogenides” have been investigated static and dynamic volt-ampere characteristics rhenium chalcogenides, obtained by electrochemical way. Studying of dynamic and static voltampere  characteristics have been shown, that there is an effect of “switching memory” in the thin covering of rhenium chalcogenides. These coverings can be used as diode in the semi-conductive technique.

“Investigation Of  Voltampere Characteristics of  Diodic Structure on Base of Thin Films of Rhenium Chalcogenides”. E.A.Salakhova, D.B.Tagiyev, P.E.Kalantarova, N.N.Khankishiyeva. 5(3) March, 2016. p.795-802.

 

JOURNALS
Useful links